News Stream- Teledyne’s Powerful New Portable X-Ray Generator featured at EU Conference for Non-Destructive Testing 2018.06.07
- Teledyne DALSA’s Smart LWIR Imaging Solutions Featured at Eurosatory 2018 2018.05.31
- Teledyne DALSA’s Uncooled LWIR Cameras Featured at AUVSI Xponential 2018.04.30
- Teledyne DALSA features uncooled LWIR Cameras at Defense and Commercial Sensing Exhibition 2018.04.12
- Teledyne DALSA’s multi-line CMOS camera honored with Gold Innovators Award 2018.04.11
Tag Archives: Design Architecture
One for All, and All for One – A Flexible Approach to CMOS Line Scan Design
Mar 19, 2013Our internal projects typically have names that are more “fun” than the part numbers that end up in our datasheets. I’ve been involved in projects with names ranging from star constellations and wine varieties to superheroes! A while back, I … Continue reading
2013.03.19
in CMOS, Color imaging, Image Sensors, Machine Vision, Semiconductors
Tagged CMOS, CMOS Image Sensor, Color Imaging, Design Architecture, Line Scan, machine vision, Pixel, sensor, stitching
Comments Off on One for All, and All for One – A Flexible Approach to CMOS Line Scan Design
